| Numéro |
J. Phys. Colloques
Volume 50, Numéro C8, Novembre 1989
36th International Field Emission Symposium
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|---|---|---|
| Page(s) | C8-343 - C8-347 | |
| DOI | https://doi.org/10.1051/jphyscol:1989858 | |
J. Phys. Colloques 50 (1989) C8-343-C8-347
DOI: 10.1051/jphyscol:1989858
APFIM ANALYSIS OF COMPOSITE MAGNETIC THIN FILMS
P.P. CAMUS1, 2, 3, R.D. SHULL1, 3 et A.J. MELMED1, 41 National Institute of Standards and Technology, Gaithersburg, MD 20899 U.S.A.
2 Surface Science Division, Gaithersburg, MD 20899, U.S.A.
3 Metallurgy Division, Gaithersburg, MD 20899, U.S.A.
4 Custom Probes Unlimited, PO. Box 3938, Gaithersburg, MD 20878, U.S.A.
Abstract
Composite thin films prepared by sputter co-deposition of Fe3O4 with small additions of Ag were investigated in this feasibility study. These nanocomposites possess unique magnetic properties which may be controlled by compositional variations. Atom probe field-ion microscopy was used to investigate the microstructure and microchemistry of the material. Field-ion microscopy in hydrogen was found to be the most suitable method to provide microstructural contrast. Atom probe analysis using electrical pulses at various temperatures proved to be feasible and indicated that the Ag is not homogeneously distributed. Even though the bulk of this material (Fe3O4) is regarded as having a low electrical conductivity, there obviously must exist enough conductivity for APFIM and this indicates that imaging and analysis of other low conductivity materials may not be as improbable as once seemed.