| Numéro |
J. Phys. Colloques
Volume 49, Numéro C5, Octobre 1988
Interface Science and Engineering '87An International Conference on the Structure and Properties of Internal Interfaces |
|
|---|---|---|
| Page(s) | C5-593 - C5-598 | |
| DOI | https://doi.org/10.1051/jphyscol:1988574 | |
An International Conference on the Structure and Properties of Internal Interfaces
J. Phys. Colloques 49 (1988) C5-593-C5-598
DOI: 10.1051/jphyscol:1988574
DIFFUSION INDUCED GRAIN BOUNDARY MIGRATION IN Ni(Zn) POLYCRYSTALS
R.A. FOURNELLE1, B. GIAKUPIAN2, W. GUST2 et B. PREDEL21 Dept. of Mechanical Engineering, Marquette University, Milwaukee, WI 53233, U.S.A.
2 Max-Planck-Institut für Metallforschung and Institut für Metallkunde, Seestrasse 92, D-7000 Stuttgart 1, F.R.G.
Abstract
Diffusion induced grain boundary migration (DIGM) has been investigated in the Ni(Zn) system for the first time by zincification of pure Ni polycrystals. The morphology of the reaction has been studied on sections parallel and perpendicular to the specimen surface. In addition to DIGM, diffusion induced recrystallization (DIR) has also been observed. The experimental results show that the boundary migration velocity during DIGM is strongly dependent on the annealing temperature. Also, the velocity depends on the depth below the nickel surface. The greater the depth, the smaller the velocity. Concentration profiles have been measured by energy dispersive X-ray analysis (EDX). The Zn concentration depends on both the annealing conditions and the depth below the surface. The concentration profiles were used as the basis for calculating the driving force, the grain boundary diffusivity and the grain boundary mobility.