Numéro
J. Phys. Colloques
Volume 49, Numéro C1, Mars 1988
IAU Colloquium N° 102 on UV and X-ray Spectroscopy of Astrophysical and Laboratory Plasmas
Page(s) C1-387 - C1-390
DOI https://doi.org/10.1051/jphyscol:1988185
IAU Colloquium N° 102 on UV and X-ray Spectroscopy of Astrophysical and Laboratory Plasmas

J. Phys. Colloques 49 (1988) C1-387-C1-390

DOI: 10.1051/jphyscol:1988185

XUV SPECTROSCOPY IN JET

K. BEHRINGER1, B. DENNE1, G. MAGYAR1, M. MATTIOLI2, N.J. PEACOCK3, J. RAMETTE2, B. SAOUTIC2 et J.L. SCHWOB4

1  JET Joint Undertaking, GB-Abingdon 0x14 3EA, Great-Britain
2  EURATOM-CEA Association, CEN Cadarache, France
3  EURATOM-UKAEA Association, Culham Laboratory, GB-Abingdon 0x14 3DB, Great-Britain
4  Racah Institute, Hebrew University, IL-91904 Jerusalem, Israel


Abstract
The 2m extreme grazing incidence XW Schwob-Fraenkel spectrometer has been described in detail [1]. Its use on the TFR tokamak is presented in a parallel paper [2]. The instrument installed on JET differs in that it has two microchannel plates scanning independently two portions of the spectral range from 10 to 335Å. A full scan takes 164 ms, due to the low number of photons. 127 spectra may be taken during a 20s tokamak discharge. The calculated and measured spectral resolution (FWHM) with a 600g/mm Bausch and Lomb grating and 20 µm entrance slit is shown in Fig. 1 for detector positions, y, between 200 and 390 mm (corresponding wavelengths of the central pixels are 85 and 310 Å, respectively).