P.I.X.E. SPECTRA MEASURED WITH GOOD RESOLUTION

F. FOLKMANN; F. FREDERIKSEN; H. LOFT NIELSEN

doi:doi:10.1051/jphyscol:1987915

Numéro		J. Phys. Colloques Volume 48, Numéro C9, Décembre 1987 X-Ray and Inner-Shell Processes Vol. 1


Page(s)		C9-99 - C9-102
DOI		https://doi.org/10.1051/jphyscol:1987915

X-Ray and Inner-Shell Processes
Vol. 1

J. Phys. Colloques 48 (1987) C9-99-C9-102
DOI: 10.1051/jphyscol:1987915

P.I.X.E. SPECTRA MEASURED WITH GOOD RESOLUTION

F. FOLKMANN, F. FREDERIKSEN and H. LOFT NIELSEN

Institute of Physics, University of Aarhus, DK-8000 Aarhus, Denmark

Abstract
A spectrometer has been built with a curved crystal and a position sensitive detector to measure x rays in a limited region with good resolution and high efficiency. A collimated ⁵⁵Fe source, electroplated onto a Pt wire, was used for checking the proportional detector. Geometrical considerations for optimating the instrument are discussed. Applications to Particle Induced X-ray Emission are considered, both for diagram lines excited by protons and heavy ion excited satellite lines.