Numéro
J. Phys. Colloques
Volume 48, Numéro C9, Décembre 1987
X-Ray and Inner-Shell Processes
Vol. 1
Page(s) C9-819 - C9-822
DOI https://doi.org/10.1051/jphyscol:19879144
X-Ray and Inner-Shell Processes
Vol. 1

J. Phys. Colloques 48 (1987) C9-819-C9-822

DOI: 10.1051/jphyscol:19879144

ON THE DETERMINATION OF COMPTON PROFILES BY ELECTRON INDUCED K-SHELL IONIZATION

K. MAHRT1, P. ESCHWEY2, H. GENZ1, Y. MAO3 and A. RICHTER1

1  Institut für Kernphysik, Technische Hochschule Darmstadt D-6100 Darmstadt, F.R.G.
2  Fa. Lurgi. D-6000 Frankfurt 90. F.R.G.
3  University of Manitoba, Winnipeg R3T 2N2, Canada


Abstract
In a coincidence experiment we have measured the double differential cross section for K-shell ionization of Cu and Ag by electrons with energies of Eo = 140 and 200 keV. The results obtained are in accordance with those of a former experiment. A comparison with theory reveals a fairly good agreement with the calculations by Das at least for emitted electron energies in the vicinity of the Møller peak, while the predictions by Cooper and Kolbenstvedt exhibit a complete different behaviour. Finally, own calculations are presented that are based on a field theoretical approach in which the double differential cross section factorizes into a Compton profile and a kinematical factor.