| Numéro |
J. Phys. Colloques
Volume 48, Numéro C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
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| Page(s) | C6-311 - C6-316 | |
| DOI | https://doi.org/10.1051/jphyscol:1987651 | |
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
J. Phys. Colloques 48 (1987) C6-311-C6-316
DOI: 10.1051/jphyscol:1987651
1 Department of Materials Science and Engineering, Osaka University, Suita, Osaka 565, Japan
2 Department of Metallurgical Engineering, Osaka University, Suita, Osaka 565, Japan
J. Phys. Colloques 48 (1987) C6-311-C6-316
DOI: 10.1051/jphyscol:1987651
ATOM PROBE FIM STUDY OF AN AMORPHOUS Pd-Si ALLOY
M. Yamamoto1, H. Yao1, S. Nenno1, I. Ohnaka2 et T. Fukusako21 Department of Materials Science and Engineering, Osaka University, Suita, Osaka 565, Japan
2 Department of Metallurgical Engineering, Osaka University, Suita, Osaka 565, Japan
Abstract
The amorphous structure of Pd84Si16 alloy wire obtained by inrotating-liquid spinning method from the liquid state, has been studied, in an atomic scale, by atom-probe field-ion microscopy. In the as-solidified specimen of Pd84Si16 alloy, whose electron diffraction pattern shows single halo ring, compositional fluctuation is found to exist in the range of 8 to 24 at% Si. The fluctuation is of the period of a few tenth nanometer, and it does not have long-range periodicity. We have discussed these experimental results with microcompositional fluctuation in terms of both amorphous structure itself and artifact effect with field evaporation.