| Numéro |
J. Phys. Colloques
Volume 47, Numéro C8, Décembre 1986
EXAFS and Near Edge Structure IV
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|---|---|---|
| Page(s) | C8-163 - C8-166 | |
| DOI | https://doi.org/10.1051/jphyscol:1986830 | |
EXAFS and Near Edge Structure IV
J. Phys. Colloques 47 (1986) C8-163-C8-166
DOI: 10.1051/jphyscol:1986830
1 SERC, Daresbury Laboratory, GB-Warrington WA4 4AD, Great-Britain
2 Department of Chemistry, University of Manchester, GB-Manchester, M13 9PL, Great-Britain
J. Phys. Colloques 47 (1986) C8-163-C8-166
DOI: 10.1051/jphyscol:1986830
DETECTION SYSTEMS FOR FLUORESCENCE EXAFS MEASUREMENT
J. BAINES1, C.D. GARNER2, S.S. HASNAIN1 et C. MORRELL11 SERC, Daresbury Laboratory, GB-Warrington WA4 4AD, Great-Britain
2 Department of Chemistry, University of Manchester, GB-Manchester, M13 9PL, Great-Britain
Abstract
The fluorescence detection systems currently in use for the measurement of EXAFS at the Daresbury Synchrotron Radiation Source are described. Each system consists of an array of NaI(Tl) scintillation detectors. Methods of reducing the proportion of counts due to scatter are discussed. The advantages and problems associated with alternative detection systems are reviewed. Results are presented from measurements of energy resolution and count rate capability obtained with a prototype MWPC with a 10 cm thickness of gas.