| Numéro |
J. Phys. Colloques
Volume 47, Numéro C2, Mars 1986
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
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|---|---|---|
| Page(s) | C2-465 - C2-470 | |
| DOI | https://doi.org/10.1051/jphyscol:1986271 | |
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C2-465-C2-470
DOI: 10.1051/jphyscol:1986271
Lehrstuhl für Festkörperphysik, Universität Erlangen-Nürnberg, Erwin-Rommel-Strasse 1, D-8520 Erlangen, F.R.G.
J. Phys. Colloques 47 (1986) C2-465-C2-470
DOI: 10.1051/jphyscol:1986271
COMPUTER-AIDED MEASUREMENT OF FIM INTENSITIES
J. WITT et K. MÜLLERLehrstuhl für Festkörperphysik, Universität Erlangen-Nürnberg, Erwin-Rommel-Strasse 1, D-8520 Erlangen, F.R.G.
Abstract
Measurement of FIM intensities can provide information on the local variation of field ionization above a tip surface and facilitate structure determination in dark areas of FIM-patterns.