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J. Phys. Colloques Vol. 45 No. C2

Le Journal de Physique Colloques

Vol. 45 No. C2 (Février 1984)

10ème Congrès International d'Optique des Rayons X et de Microanalyse
10th International Congress on X-Ray Optics and Microanalysis



  • HISTORY OF QUANTITATIVE ELECTRON PROBE MICROANALYSIS     p. C2-3
    K.F.J. Heinrich
    Abstract | PDF file (239.8 KB)


  • EVALUATION OF CORRECTION PROCEDURES FOR QUANTITATIVE LIGHT ELEMENT EPMA     p. C2-9
    I.B. Borovskii, A.I. Kozlenkov and T.A. Bolochova
    Abstract | PDF file (259.0 KB)


  • A MONTE CARLO SIMULATION APPROACH TO THIN FILM ELECTRON MICROPROBE ANALYSIS BASED ON THE USE OF MOTT SCATTERING CROSS-SECTIONS     p. C2-13
    K. Murata, S. Cvikevich and J.D. Kuptsis
    Abstract | PDF file (208.7 KB)


  • EXTENSION DES POSSIBILITÉS QUANTITATIVES DE LAMICROANALYSE PAR UNE FORMULATION NOUVELLE DES EFFETS DE MATRICE     p. C2-17
    J.L. Pouchou and F. Pichoir
    Abstract | PDF file (175.9 KB)


  • AN IMPROVED ABSORPTION CORRECTION FOR QUANTITATIVE ANALYSIS     p. C2-21
    G. Love, D.A. Sewell and V.D. Scott
    Abstract | PDF file (155.8 KB)


  • MICROANALYSE EN INCIDENCE RASANTE     p. C2-25
    C. Landron and K. Raouadi
    Abstract | PDF file (147.5 KB)


  • THICKNESS DETERMINATION OF Al FILMS ON Si BY A MONTE CARLO CODE INCLUDING A SECONDARY FLUORESCENCE CORRECTION     p. C2-29
    A. Armigliato, A. Desalvo, A . Garulli and R. Rosa
    Abstract | PDF file (151.4 KB)


  • X-RAY STUDIES RELATED TO COATING THICKNESS MEASUREMENTS     p. C2-33
    D.A. Sewell, I.D. Hall, G. Love, J.P. Partridge and V.D. Scott
    Abstract | PDF file (150.2 KB)


  • AN EXPERIMENTAL TEST OF A ZAF CORRECTION PROGRAM FOR TILTED SPECIMENS AND ENERGY DISPERSIVE SPECTROMETRY     p. C2-37
    B. Lödding and L. Reimer
    Abstract | PDF file (124.3 KB)


  • AN EVALUATION OF X-RAY LOSS DUE TO ELECTRON BACKSCATTER     p. C2-41
    R.L. Myklebust
    Abstract | PDF file (83.50 KB)


  • A CORRECTION PROCEDURE FOR CHARACTERISTIC FLUORESCENCE IN MICROPROBE ANALYSIS NEAR PHASE BOUNDARIES     p. C2-43
    G.F. Bastin, F.J.J. van Loo, P.J.C. Vosters and J.W.G.A. Vrolijk
    Abstract | PDF file (157.3 KB)


  • ANALYSE D'ÉCHANTILLONS STRATIFIÉS À LA MICROSONDE ÉLECTRONIQUE     p. C2-47
    J.L. Pouchou and F. Pichoir
    Abstract | PDF file (187.8 KB)


  • QUANTUM-MECHANICAL BASED VERSION OF X-RAY CHARACTERISTIC ATTENUATION COEFFICIENTS     p. C2-51
    O.S. Marenkov
    Abstract | PDF file (89.81 KB)


  • EVALUATION DES EFFETS DE DIFFRACTION SUR LES SIGNAUX OBTENUS À PARTIR DES MICROSONDES ÉLECTRONIQUES     p. C2-53
    J. Henoc, P. Henoc, F. Maurice and K. Raouadi
    Abstract | PDF file (170.2 KB)


  • X-RAY MICROSCOPY AND MICROANALYSIS : INTRODUCTORY SURVEY     p. C2-59
    V.E. Cosslett
    Abstract | PDF file (694.5 KB)


  • METALLIC MULTILAYERS MIRRORS : NEW POSSIBILITIES FOR SOFT X-RAY IMAGING AND SPECTROSCOPY     p. C2-65
    P. Dhez
    Abstract | PDF file (158.9 KB)


  • ADVANCES IN X-RAY OPTICS AT THE NATIONAL PHYSICAL LABORATORY     p. C2-69
    A. Franks
    Abstract | PDF file (484.4 KB)


  • PHOTOELECTRON X-RAY MICROSCOPY     p. C2-73
    F. Polack and S. Lowenthal
    Abstract | PDF file (486.0 KB)


  • HIGH RESOLUTION X-RAY MICROSCOPY WITH ZONE PLATE MICROSCOPES     p. C2-77
    G. Schmahl, D. Rudolph and B. Niemann
    Abstract | PDF file (1.251 MB)


  • LARGE FIELD X-RAY ABSORPTION MICRO-ANALYSIS NEAR AN ABSORPTION EDGE BY IMAGE PROCESSING     p. C2-83
    E. Bigler and F. Polack
    Abstract | PDF file (676.4 KB)


  • AN IMAGING SOFT X-RAY MICROSCOPE AT THE DARESBURY SYNCHROTRON RADIATION SOURCE     p. C2-87
    M.T. Browne, R.E. Burge, P. Charalambous, P.J. Duke, A. Freake, A. McDowell, A. Michette, G. Nave, R. Rosser, M.J. Simpson and W. Smith
    Abstract | PDF file (86.67 KB)


  • A NEW LITHOGRAPHIC TECHNIQUE FOR THE MANUFACTURE OF HIGH RESOLUTION ZONE PLATES FOR SOFT X-RAYS     p. C2-89
    M.T. Browne, P. Charalambous, R.E. Burge, P.J. Duke, A.G. Michette and M.J. Simpson
    Abstract | PDF file (1.519 MB)


  • THE EFFECTS OF MANUFACTURING INACCURACIES ON THE IMAGING PROPERTIES OF ZONE PLATES     p. C2-93
    M.J. Simpson, M.T. Browne, R.E. Burge, P. Charalambous, P.J. Duke and A.G. Michette
    Abstract | PDF file (159.1 KB)


  • THREE DIMENSIONAL IMAGING IN SCANNING SOFT X-RAY MICROSCOPY     p. C2-97
    L.M. Cheng and A.G. Michette
    Abstract | PDF file (1.178 MB)


  • COMPARISON OF SECONDARY ION MASS SPECTROMETRY (SIMS) WITH ELECTRON MICROPROBE ANALYSIS (EPMA) AND OTHER THIN FILM ANALYTICAL METHODS     p. C2-103
    H.W. Werner and A.P. von Rosenstiel
    Abstract | PDF file (822.9 KB)


  • DEPTH RESOLUTION IN ION SPUTTERING - AN ASPECT OF QUANTITATIVEMICROANALYSIS     p. C2-115
    J. Giber, D. Marton and J. László
    Abstract | PDF file (122.6 KB)


  • APPLICATION OF CESIUM PRIMARY BEAM TO THE CHARACTERIZATION OF III.V SEMICONDUCTORS BY SIMS     p. C2-119
    M. Gauneau, R. Chaplain and A. Rupert
    Abstract | PDF file (218.4 KB)


  • MÉTHODE D'ANALYSE FONDÉE SUR L'IONISATION PAR ÉLECTRONS DES PRODUITS DE PULVÉRISATION THERMALISÉS     p. C2-125
    G. Blaise, R. Castaing and R. Quettier
    Abstract | PDF file (778.4 KB)


  • MÉCANISME DE FORMATION D'IONS POLYATOMIQUES SECONDAIRES. APPLICATIONS AUX IONS Cu+2 ET Cu+3     p. C2-129
    P. Joyes
    Abstract | PDF file (131.9 KB)


  • SHADOWING EFFECTS OBSERVED IN SLOW IONS BACKSCATTERING ON A METALLIC CRYSTAL : EXPERIMENTS AND SIMULATIONS     p. C2-133
    C. Coudray
    Abstract | PDF file (200.5 KB)


  • ASPECTS ANALYTIQUES DES ÉMISSIONS D'IONS SECONDAIRES ET D'ÉLECTRONS AUGER PAR LES ALLIAGES Fe-Al ET Cu-Al BOMBARDÉS EN ULTRA-VIDE PAR DES IONS Ar+     p. C2-139
    P. Viaris de Lesegno, R.-L. Inglebert and J.-F. Hennequin
    Abstract | PDF file (200.1 KB)


  • SUPPRESSION OF MOLECULAR IONS IN SECONDARY ION MASS SPECTRA     p. C2-143
    N.S. McIntyre, W.J. Chauvin, J.B. Metson and G.M. Bancroft
    Abstract | PDF file (162.5 KB)


  • INSTRUMENTATION, ELECTRON OPTICS AND X-RAY SPECTROSCOPY     p. C2-149
    T. Mulvey
    Abstract | PDF file (306.9 KB)


  • ENERGY SPREAD MEASUREMENT IN FIELD ELECTRON MICROSCOPY     p. C2-155
    M. Troyon and Jiang Jia-Ying
    Abstract | PDF file (93.36 KB)


  • X-RAY GRAZING INCIDENCE OPTICS FOR THE ELECTRON MICROPROBE     p. C2-157
    A.I. Kozlenkov and A.I. Shulgin
    Abstract | PDF file (210.3 KB)


  • MATHEMATICAL SIMULATION OF X-RAY OPTICAL SYSTEMS USING MONTE CARLO METHOD     p. C2-161
    V.P. Nikolaev, R.I. Plotnikov, O.S. Marenkov and T.V. Singarieva
    Abstract | PDF file (933.2 KB)


  • CHROMATIC CHANGE IN MAGNIFICATION AND IN ROTATION FOR MAGNETIC LENSES     p. C2-165
    A.A. Alshwaikh
    Abstract | PDF file (169.1 KB)


  • CARACTÉRISTIQUES DU "MEBIS" : MICROSCOPE À BALAYAGE FONCTIONNANT IN SITU     p. C2-169
    B. Jouffrey, J. Trinquier and J.L. Franceschi
    Abstract | PDF file (1.405 MB)


  • ÉTUDE, AU PREMIER ORDRE, D'UN SYSTÈME DISPERSIF, MAGNÉTIQUE, SYMÉTRIQUE, DE TYPE ALPHA     p. C2-171
    J.Ph. Perez, J. Sirven, A. Seguela and J.C. Lacaze
    Abstract | PDF file (121.7 KB)


  • ACCURACY, REPRODUCIBILITY AND SCOPE FOR X-RAY MICROANALYSIS WITH Si(Li) DETECTORS     p. C2-175
    P.J. Statham
    Abstract | PDF file (239.1 KB)


  • QUANTITATIVE LIGHT ELEMENT ANALYSIS USING EDS     p. C2-181
    D.J. Bloomfield, G. Love and V.D. Scott
    Abstract | PDF file (180.1 KB)


  • BORON ANALYSIS AND MAPPING WITH A WINDOWLESS ENERGY DISPERSIVE DETECTOR     p. C2-185
    A.O. Sandborg and M.E. Whitehead
    Abstract | PDF file (690.5 KB)


  • THE INTENSITY ENHANCEMENT OF X-RAYS REFLECTED BY AN ANALYZING CRYSTAL MADE OF A THIN FILM     p. C2-189
    T.S. Uragami
    Abstract | PDF file (584.2 KB)


  • PROCESSING INFORMATION FROM SCANNING INSTRUMENTS     p. C2-195
    P.W. Hawkes
    Abstract | PDF file (324.8 KB)


  • USE OF COLOR SCALES IN MICROANALYTICAL MAPS     p. C2-201
    K.F.J. Heinrich
    Abstract | PDF file (2.639 MB)


  • USE OF THE X-RAY MICROANALYSER AS AN IMAGE ANALYSER     p. C2-211
    M.P. Jones
    Abstract | PDF file (164.4 KB)


  • AN INTEGRATED SYSTEM FOR COLLECTION AND PROCESSING OF ANALYTICAL AND IMAGE DATA FROM THE SEM/STEM     p. C2-215
    J.J. McCarthy and J.P. Benson
    Abstract | PDF file (152.7 KB)


  • COMPUTER TECHNIQUES FOR TOPOGRAPHICAL ANALYSIS IN THE SCANNING ELECTRON MICROSCOPE     p. C2-219
    P. Atkin and K.C.A. Smith
    Abstract | PDF file (187.4 KB)


  • A USER DESIGNED SOFTWARE SYSTEM FOR ELECTRON MICROPROBES - BASIC PREMISES AND THE CONTROL PROGRAM+     p. C2-223
    W.F. Chambers and J.H. Doyle
    Abstract | PDF file (761.4 KB)


  • A USER DESIGNED SOFTWARE SYSTEM FOR ELECTRON MICROPROBES - QUALITATIVE AND QUANTITATIVE TECHNIQUES+     p. C2-227
    J.H. Doyle and W.F. Chambers
    Abstract | PDF file (178.7 KB)


  • EXTENDED SOFTWARE POSSIBILITIES IN X-RAY MICROANALYSIS     p. C2-231
    D. Grman and W.J. Muster
    Abstract | PDF file (131.2 KB)


  • CARACTÉRISATION DE LA MORPHOLOGIE DE CHARGES PAR MICROSCOPIE ÉLECTRONIQUE À TRANSMISSION, ANALYSE D'IMAGES, ET TRAITEMENT DES DONNÉES     p. C2-235
    B. Brachon, Y. Chevallier, B. Gariazzo, J. Marnat, M. Thévenard and P. Lamy
    Abstract | PDF file (106.6 KB)


  • ELECTRON DIFFRACTION ANALYSIS     p. C2-239
    M.E. Whitehead and V. Balmer
    Abstract | PDF file (428.3 KB)


  • NUCLEAR MICROPROBE ANALYSIS AT KARLSRUHE     p. C2-245
    D. Heck
    Abstract | PDF file (994.1 KB)


  • LASER RAMAN MICROPROBING TECHNIQUES     p. C2-249
    P. Dhamelincourt, J. Barbillat and M. Delhaye
    Abstract | PDF file (269.5 KB)


  • LE MICRODIL 28 : MICROSONDE RAMAN À DÉTECTION MULTICANALE     p. C2-255
    J. Barbillat, P. Dhamelincourt and M. Delhaye
    Abstract | PDF file (79.84 KB)


  • MICROANALYSE PHYSICOCHIMIQUE SUPERFICIELLE DU POLYÉTHYLÈNE PAR SPECTROMÉTRIES VIBRATIONNELLES     p. C2-257
    D. Dothée, M. Camelot and C. Roques-Carmes
    Abstract | PDF file (155.4 KB)


  • LASER MICROPROBE MASS ANALYSIS DETECTION LIMITS AND LATERAL RESOLUTION     p. C2-261
    P. Wieser, R. Wurster and H. Seiler
    Abstract | PDF file (1017 KB)


  • QUANTITATIVE MICROANALYSIS OF SOLID SAMPLES WITH THE LASER PROBE MASS SPECTROMETRY II (L.P.M.S. II)     p. C2-265
    J.F. Eloy
    Abstract | PDF file (160.8 KB)


  • X-RAY PHOTOELECTRON MICROPROBE ANALYSIS AND RELATED TECHNIQUES     p. C2-271
    J. Cazaux, D. Gramari, D. Mouze, A.G. Nassiopoulos and J. Perrin
    Abstract | PDF file (1.123 MB)


  • SYNCHROTRON RADIATION PLUS PHOTODIODE ARRAY : EXAFS IN DISPERSIVE MODE FOR FAST MICROANALYSIS     p. C2-275
    E. Dartyge, A.M. Flank, A. Fontaine and A. Jucha
    Abstract | PDF file (79.46 KB)


  • 1 keV X-RAY ABSORPTION SPECTROSCOPY OF BULK MATERIALS BY ELECTRON YIELD MEASUREMENT     p. C2-279
    J.M. Esteva and R.C. Karnatak
    Abstract | PDF file (76.32 KB)


  • X-RAY FLUORESCENCE ANALYSIS WITH MONOCHROMATIC X-RAYS     p. C2-281
    M. Kotera and D.B. Wittry
    Abstract | PDF file (119.5 KB)


  • MASS TRANSPORT AT THE LASERGLAZING OF METALS     p. C2-285
    I.B. Borovskii, D.D. Gorodskii and I.M. Sharafeev
    Abstract | PDF file (740.1 KB)


  • QUANTITATIVE SCANNING ELECTRON MICROSCOPY OF SURFACES     p. C2-291
    L. Reimer
    Abstract | PDF file (1.243 MB)


  • TOTAL RATE IMAGING WITH X-RAYS IN A SCANNING ELECTRON MICROSCOPE     p. C2-297
    P. Bernsen and L. Reimer
    Abstract | PDF file (505.5 KB)


  • ANALYTICAL LOW VOLTAGE SEM IN UHV FOR SOLID SURFACE     p. C2-301
    T. Ichinokawa, H. Ampo and S. Kinoshita
    Abstract | PDF file (2.344 MB)


  • CANON À ÉMISSION DE CHAMP POUR MICROANALYSE PAR SPECTROSCOPIE D'ÉLECTRONS AUGER     p. C2-307
    P. Morin and F. Simondet
    Abstract | PDF file (429.7 KB)


  • SCANNING AUGER MICROANALYSIS AT HIGH ENERGY PROBES     p. C2-309
    M. Tholomier, P. Morin, E. Vicario and N. Mubanga
    Abstract | PDF file (686.0 KB)


  • ANALYTICAL SEM FOR SURFACE SCIENCE     p. C2-313
    J.D. Geller and A. Mogami
    Abstract | PDF file (89.93 KB)


  • ON CHANGES OF SECONDARY EMISSION BY RESONANT TUNNELING VIA ADSORBATES     p. C2-315
    J. Halbritter
    Abstract | PDF file (139.3 KB)


  • THE EFFECTS OF SURFACE ROUGHNESS ON AUGER ELECTRON SPECTROSCOPY     p. C2-319
    D. Wehbi and C. Roques-Carmes
    Abstract | PDF file (445.5 KB)


  • MICROSCOPIC STUDY OF SURFACES BY AUGER TYPE EMISSION     p. C2-323
    C. Le Gressus
    Abstract | PDF file (1.039 MB)


  • ANALYSE QUANTITATIVE DES SURFACES PAR SPECTROMÉTRIE D'ÉLECTRONS     p. C2-329
    J.P. Duraud and C. Quenisset
    Abstract | PDF file (151.3 KB)


  • AMÉLIORATION PAR MICRO-ORDINATEUR DES ACQUISITIONS DE DONNÉES EN SPECTROMÉTRIE AUGER     p. C2-333
    T.T. Nguyen, C. Aubin and J.P. Henon
    Abstract | PDF file (132.6 KB)


  • THE EFFECTS OF X-RAY-INDUCED AUGER ELECTRONS IN AUGER MICROANALYSIS     p. C2-337
    J. Cazaux, D. Gramari, S. Moutou and A.G. Nassiopoulos
    Abstract | PDF file (178.3 KB)


  • THRESHOLD SPECTROSCOPIES AND THEIR PROSPECTS FOR MICROANALYSIS     p. C2-341
    J. Kirschner
    Abstract | PDF file (190.8 KB)


  • ÉMISSION ÉLECTRONIQUE ASSOCIÉE À L'INTERACTION MÉTASTABLE - SURFACE     p. C2-345
    C. Boiziau
    Abstract | PDF file (187.4 KB)


  • ÉTUDE PAR SPECTROSCOPIE DE DÉSEXCITATION D'ATOMES MÉTASTABLES D'UN FILM MINCE DE POLYACRYLONITRILE ÉLECTROPOLYMÉRISÉ     p. C2-349
    C. Lecayon and C. Reynaud
    Abstract | PDF file (174.8 KB)


  • STUDY OF CHEMICAL COMPOSITION AND ELECTRONIC STRUCTURE OF HIGH-MELTING COMPOUNDS OF ZIRCONIUM BY ELECTRONIC AES     p. C2-353
    I.A. Brytov, A.S. Wander and V.S. Neshpor
    Abstract | PDF file (207.1 KB)


  • REHEAT CRACKING STUDIES BY SCANNING AUGER AND ELECTRON MICROSCOPY INVESTIGATIONS     p. C2-357
    H. Horn and M. Weiss
    Abstract | PDF file (1.920 MB)


  • APPORT DE LA MICROSCOPIE ÉLECTRONIQUE SOUS INCIDENCE RASANTE À L'ÉTUDE DES SURFACES, APPLICATION AU LAITON 70/30     p. C2-361
    E. Darque-Ceretti, M.Y. Perrin and F. Delamare
    Abstract | PDF file (632.5 KB)


  • ÉTUDE PAR MICROSCOPIE ÉLECTRONIQUE À BALAYAGE ET SPECTROMÉTRIE AUGER DE RUPTURES FRAGILES DU TUNGSTÈNE     p. C2-367
    Tran Huu Loi, E. Lhuire, J.P. Morniroli and M. Gantois
    Abstract | PDF file (1.058 MB)


  • LOW-ENERGY ELECTRON-INDUCED X-RAY SPECTROMETRY : A TECHNIQUE FOR SOLID SURFACE STUDIES     p. C2-371
    M.J. Romand, R. Bador, C. Desuzinges, M. Charbonnier, A. Roche and F. Gaillard
    Abstract | PDF file (986.6 KB)


  • DOSAGE DES ALCALINS À LA SURFACE DES VERRES SILICATÉS     p. C2-375
    M. Sfar, J.P. Lacharme, P. Lepeut and P. Champion
    Abstract | PDF file (198.8 KB)


  • STEM-EDS X-RAY MICROANALYSIS IN THIN METAL FOILS     p. C2-381
    P. Doig and P.E.J. Flewitt
    Abstract | PDF file (467.2 KB)


  • ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY WITH A THERMALLY STABILIZED FIELD EMISSION GUN     p. C2-387
    B. Thomas, J. Bourgeot, P. Chemelle and A. Rîbes
    Abstract | PDF file (85.97 KB)


  • THE PREPARATION OF MULTI-ELEMENT SALT STANDARDS FOR CALIBRATION OF EDX-SYSTEMS IN STEM USING AEROSOL TECHNIQUES     p. C2-389
    H.G. Fromme, M. Grote, J. Schaffstein, W. Holländer and B. Bechtloff
    Abstract | PDF file (1.407 MB)


  • THEORETICAL STUDY OF THE SPATIAL RESOLUTION OF X-RAY MICROANALYSIS IN ANALYTICAL ELECTRON MICROSCOPY     p. C2-393
    K. Murata, M. Kawamura and K. Nagami
    Abstract | PDF file (182.5 KB)


  • AEM ANALYSIS OF STAINLESS STEEL     p. C2-397
    R.E. Ogilvie
    Abstract | PDF file (115.0 KB)


  • QUANTITATIVE X-RAY ENERGY DISPERSIVE ANALYSIS OF THIN FOILS     p. C2-401
    W.E. Voice and R.G. Faulkner
    Abstract | PDF file (362.2 KB)


  • DETERMINATION OF CLIFF-LORIMER k FACTORS FOR A HITACHI H700H 200 kV SCANNING TRANSMISSION ELECTRON MICROSCOPE     p. C2-407
    E. Metcalfe and J.P. Broomfield
    Abstract | PDF file (159.7 KB)


  • A PARAMETERLESS METHOD TO CORRECT FOR X-RAY ABSORPTION AND FLUORESCENCE I N THIN FILM MICROANALYSIS     p. C2-411
    E. Van Cappellen, D. Van Dyck, J. Van Landuyt and F. Adams
    Abstract | PDF file (177.6 KB)


  • QUANTITATIVE TRANSMISSION ANALYTICAL MICROSCOPY OF SUPERALLOYS     p. C2-415
    W.E. Voice and R.G. Faulkner
    Abstract | PDF file (415.6 KB)


  • ESSAIS DE CARACTÉRISATION DE LA SÉGRÉGATION INTERGRANULAIRE DANS LES JOINTS DE GRAINS D'ALLIAGES Ni - Si EN ANALYSE PAR EMISSION X - STEM     p. C2-419
    L. Beaunier, H. Dexpert and C. Vignaud
    Abstract | PDF file (420.5 KB)


  • TRENDS IN EELS WITHIN THE FIELD OF MICROANALYSIS     p. C2-423
    R.F. Egerton
    Abstract | PDF file (785.4 KB)


  • AN ELECTRON ENERGY LOSS SPECTRAL LIBRARY AND ITS APPLICATION TO MATERIALS SCIENCE     p. C2-429
    N.J. Zaluzec
    Abstract | PDF file (480.9 KB)


  • FINE STRUCTURE IN EELS FROM RARE EARTH SESQUIOXIDE THIN FILMS     p. C2-433
    L.M. Brown, C. Colliex and M. Gasgnier
    Abstract | PDF file (482.7 KB)


  • OBTAINING ELECTRON ENERGY LOSS SPECTRA AND X-RAY EMISSION SPECTRA FREE OF INSTRUMENTAL ARTIFACTS     p. C2-437
    A.J. Craven, P.F. Adam, W.A.P. Nicholson, J.N. Chapman and R.P. Ferrier
    Abstract | PDF file (965.1 KB)


  • MICROANALYSIS TECHNIQUE USING ELECTRON ENERGY LOSS SPECTROSCOPY IN HIGH VOLTAGE ELECTRON MICROSCOPY     p. C2-441
    J. Sevely, Y. Kihn, G. Zanchi and B. Jouffrey
    Abstract | PDF file (133.7 KB)


  • QUANTITATIVE X-RAY MICROANALYSIS OF BIOLOGICAL CRYOSECTIONS DEPENDS ON ICE CRYSTAL DAMAGE     p. C2-447
    K. Zierold
    Abstract | PDF file (1.373 MB)


  • MICROANALYSIS ON BIOLOGICAL MATERIAL - THE ROLE OF PREPARATION METHODS AT LOW TEMPERATURES AND A POSSIBLE LINK WITH (IMMUNO)CYTOCHEMISTRY     p. C2-451
    P.M. Frederik, P.H.H. Bomans, W.M. Busing and R. Odselius
    Abstract | PDF file (226.3 KB)


  • ELECTRON MICROPROBE MEASUREMENTS OF INTRACELLULAR HYDRATION IN FREEZE-DRIED, PLASTIC-EMBEDDED BIOLOGICAL SOFT TISSUE     p. C2-457
    F.D. Ingram and M.J. Ingram
    Abstract | PDF file (189.3 KB)


  • QUANTITATIVE MICROANALYSIS OF CALCIUM SUBCELLULAR COMPARTMENTS IN RESIN-EMBEDDED TISSUE SECTIONS (X-RAY WAVELENGTH DISPERSIVE SPECTROMETRY)     p. C2-461
    G. Nicaise, J. Amsellem, S. Blaineau and F. Hemming
    Abstract | PDF file (122.7 KB)


  • QUANTITATIVE X-RAY MICROANALYSIS OF CALCIUM IN AN OSMIUM-TREATED BIOLOGICAL SPECIMEN     p. C2-463
    S. Blaineau, J. Amsellem and G. Nicaise
    Abstract | PDF file (120.1 KB)


  • QUANTITATIVE ELECTRONPROBE MICROANALYSIS OF THE EPIPHYSEAL GROWTH PLATE     p. C2-465
    E.-R. Krefting, G. Lissner (Willner) and H.J. Höhling
    Abstract | PDF file (1.142 MB)


  • STANDARDS FOR QUANTITATIVE X-RAY MICROANALYSIS OF BIOLOGICAL SPECIMENS     p. C2-469
    W.C. de Bruijn
    Abstract | PDF file (1.008 MB)


  • COMPARISON OF QUANTITATIVE DATA FROM ATOMIC ABSORPTION SPECTROMETRY AND X-RAY MICROANALYSIS FOR INORGANIC AND BIOLOGICAL SAMPLES     p. C2-473
    P. Mery, D. Chriqui, D.J. Gallant, B. Bouchet and B.K. Tripathi
    Abstract | PDF file (221.7 KB)


  • QUANTITATIVE ELECTRON PROBE ANALYSIS OF HAEMOLYMPH AND URINE COMPOSITION FROM INSECT CALLIPHORA ERYTHROCEPHALA DURING METAMORPHOSIS     p. C2-481
    W. Alkassis, N. Roinel and N. Koechlin
    Abstract | PDF file (776.3 KB)


  • ENERGY DISPERSIVE X-RAY MICROANALYSIS OF PLATELETS AND MEGAKARYOCYTES OF SEVERAL MAMMALS USING AIR-DRIED SPREADS AND FRESH FROZEN DRIED SECTIONS     p. C2-485
    K. Takaya
    Abstract | PDF file (850.7 KB)


  • MICROANALYSE X DES ÉLÉMENTS DIFFUSIBLES EN BIOLOGIE VÉGÉTALE     p. C2-491
    J.-P. Garrec
    Abstract | PDF file (1.217 MB)


  • COMPOSITION ÉLÉMENTAIRE DE DIVERS TYPES DE GRANULES DANS LES CELLULES COTYLÉDONAIRES DU RADIS     p. C2-495
    L. Geneves and S. Halpern
    Abstract | PDF file (674.4 KB)


  • ELECTRON MICROPROBE ANALYSIS OF SOUND AND PITTED TISSUES OF APPLE FRUIT AFFECTED WITH BITTER PIT     p. C2-499
    A. Chamel, P. Bondoux and J.P. Bossy
    Abstract | PDF file (97.58 KB)


  • SUR LA LOCALISATION DES ÉLÉMENTS MINÉRAUX DANS LES SUCOIRS D'OSYRIS ALBA L.     p. C2-503
    S. Renaudin, H. Ben Harrat, D.J. Gallant and B. Bouchet
    Abstract | PDF file (898.0 KB)


  • RELATIONS ENTRE LES CONCENTRATIONS EN CALCIUM, MAGNÉSIUM ET PHOSPHORE DANS LES MITOCHONDRIES, LES PROPLASTES ET LES CHLOROPLASTES DU LUPIN JAUNE ET DE LA FÉVEROLE ET LE TAUX DE CALCIUM DU MILIEU DE CULTURE     p. C2-507
    S. Chevalier and N. Paris-Pireyre
    Abstract | PDF file (810.8 KB)


  • LA SILICE CHEZ LE BLÉ (TRITICUM AESTIVUM L.). COMPARAISON ENTRE UNE VARIÉTÉ SENSIBLE ET UNE VARIÉTÉ RÉSISTANTE À LA VERSE     p. C2-511
    S. Gartner and N. Paris-Pireyre
    Abstract | PDF file (597.5 KB)


  • ELECTRON PROBE ANALYSIS OF SAP EXUDATES OF TWO VARIETIES OF WHEAT (TRITICUM AESTIVUM L.)     p. C2-515
    S. Gartner, N. Roinel and N. Paris-Pireyre
    Abstract | PDF file (1.356 MB)


  • MISE EN ÉVIDENCE DE DEUX FONCTIONS LYSOSOMALES THYROIDIENNES EN MICROANALYSE PAR SONDE ÉLECTRONIQUE ET SPECTROMÉTRIE DES RAYONS X     p. C2-519
    E. Larras-Regard, L. Bessière, S. Halpern and P. Galle
    Abstract | PDF file (638.1 KB)


  • DETERMINATION OF FLUORINE IONS PENETRATION DEGREE INTO ENAMEL BY EMPA     p. C2-523
    D. Beloica, M. Vulovik, I. Grzetik, D. Golijanin and M.K. Pavikevik
    Abstract | PDF file (177.8 KB)


  • ASSESSMENT OF INTERSTITIAL LUNG MACROPHAGE PARTICLE BURDEN BY ANALYTICAL TRANSMISSION ELECTRON MICROSCOPE     p. C2-529
    B. Chamak, P. Sébastien, J.F. Bernaudin, A. Gaudichet and M.C. Pinchon
    Abstract | PDF file (480.3 KB)


  • ESSAI D'ANALYSE QUANTITATIVE PAR ÉMISSION IONIQUE SECONDAIRE SUR COUPES HISTOLOGIQUES     p. C2-533
    M. Truchet
    Abstract | PDF file (161.5 KB)


  • DISTRIBUTION DU GALLIUM DANS DIFFÉRENTS TISSUS DE MAMMIFÈRES - ÉTUDE EN MICROANALYSE PAR ÉMISSION IONIQUE SECONDAIRE ET PAR SPECTROMÉTRIE DE RAYONS X     p. C2-537
    J.P. Berry, S. Galle and F. Escaig
    Abstract | PDF file (774.1 KB)


  • THULIUM BIOACCUMULATION BY THE SHORE CRAB CARCINUS MAENAS COLLECTED FROM THE FRENCH COASTS OF THE CHANNEL : A STRUCTURAL, ULTRASTRUCTURAL AND MICROANALYTICAL STUDY BY SECONDARY ION MASS AND X RAY SPECTROMETRY     p. C2-541
    C. Chassard-Bouchaud, P. Hallegot and M. Meignan
    Abstract | PDF file (1.008 MB)


  • UPTAKE, STORAGE AND EXCRETION OF URANIUM BY MYTILUS EDULIS, A STRUCTURAL, ULTRASTRUCTURAL AND MICROANALYTICAL STUDY BY SECONDARY ION EMISSION AND X RAY SPECTROMETRY     p. C2-545
    C. Chassard-Bouchaud and F. Escaig
    Abstract | PDF file (1.285 MB)


  • MÉTHODE POUR L'ÉTUDE EN MICROSCOPIE IONIQUE ANALYTIQUE, PHOTONIQUE ET ÉLECTRONIQUE D'UNE MÊME CELLULE     p. C2-549
    P. Mandon, F. Escaig and F. Vinzens
    Abstract | PDF file (1.462 MB)


  • BIOMEDICAL AND ENVIRONMENTAL APPLICATIONS OF SECONDARY ION EMISSION MICROANALYSIS     p. C2-553
    R.W. Linton
    Abstract | PDF file (710.9 KB)


  • ANALYSE HISTOLOGIQUE PAR MICROSPECTROMÉTRIE RAMAN     p. C2-557
    M. Truchet
    Abstract | PDF file (223.1 KB)


  • DOPED ALBUMIN : STANDARDIZATION POSSIBILITIES FOR LAMMA-ANALYSIS OF THIN FREEZE-DRIED CRYOSECTIONS OF BIOLOGICAL TISSUE     p. C2-561
    A.H. Verbueken, W.A. Jacob, P .M. Frederik, W.M. Busing, R.C. Hertsens and R.E. Van Grieken
    Abstract | PDF file (180.9 KB)


  • RESULTS ON TAXONOMY AND PHYSIOLOGICAL STATE OF BACTERIA DERIVED FROM LASER-INDUCED SINGLE CELL ANALYSIS     p. C2-565
    B. Lindner and U. Seydel
    Abstract | PDF file (130.7 KB)


  • THE USE OF LASER MICROPROBE MASS ANALYSIS IN BIOMEDICAL RESEARCH     p. C2-569
    P.F. Schmidt and H. Zumkley
    Abstract | PDF file (917.1 KB)


  • MICROANALYSIS WITH THE LASER PROBE MASS SPECTROGRAPH (LPMS) IN PLANT BIOLOGY     p. C2-573
    A. Chamel and J.-F. Eloy
    Abstract | PDF file (159.1 KB)


  • RECENT RESULTS IN EELS ELEMENTAL MAPPING OF THIN BIOLOGICAL SECTIONS     p. C2-577
    C. Jeanguillaume, J.P. Berry, C. Colliex, P. Galle, M. Tence and P . Trebbia
    Abstract | PDF file (1.224 MB)


  • APPLICATION DE LA SPECTROSCOPIE DE PERTES D'ÉNERGIE D'ÉLECTRONS À HAUTE TENSION À L'ANALYSE DE MICROPARTICULES DANS DES COUPES DE TISSUS BIOLOGIQUES     p. C2-581
    J.P. Berry, P. Galle, Y. Kihn, G. Zanchi, J. Sevely and B. Jouffrey
    Abstract | PDF file (1.190 MB)


  • AN EELS STUDY OF THE INTRANUCLEAR INCLUSIONS OF THE EPIDIDYMIS PRINCIPAL CELLS IN THE GARDEN DORMOUSE, ELIOMYS QUERCINUS L.     p. C2-585
    F. Hawkes, Y. Kihn and J. Sevely
    Abstract | PDF file (786.6 KB)


  • CADMIUM DISTRIBUTION IN INSECT TESTIS AFTER A SINGLE INJECTION, AN EELS STUDY     p. C2-587
    F. Hawkes and Wu Ming-jun
    Abstract | PDF file (63.03 KB)


  • PLATINUM DISTRIBUTION IN INSECT TESTIS AFTER CIS-DIAMMINEDICHLOROPLATINUM TREATMENT, AN EELS STUDY IN THE HOUSE CRICKET, ACHETA DOMESTICUS     p. C2-589
    F. Hawkes
    Abstract | PDF file (51.09 KB)


  • GALLIUM DISTRIBUTION IN INSECT TESTIS AFTER AN INJECTION OF GaCl3, AN EELS STUDY IN THE HOUSE CRICKET, ACHETA DOMESTICUS     p. C2-591
    F. Hawkes
    Abstract | PDF file (329.2 KB)


  • INDIUM DISTRIBUTION IN INSECT TESTIS AFTER AN INJECTION OF InCl3, AN EELS STUDY IN THE HOUSE CRICKET, ACHETA DOMESTICUS     p. C2-593
    F. Hawkes
    Abstract | PDF file (310.8 KB)


  • CATION BINDING TO ANIONIC BIOPOLYMERS OF VASCULAR CONNECTIVE TISSUE     p. C2-595
    G. Siegel, A. Walter and B. Lindman
    Abstract | PDF file (812.6 KB)


  • ASPECTS MORPHOLOGIQUES DE LA CROISSANCE CRISTALLINE D'UN CALCUL RÉNAL     p. C2-599
    Z. Fakhfakh and A. El Hili
    Abstract | PDF file (514.5 KB)


  • UTILISATION DE LA SPECTROSCOPIE DE PERTES D'ÉNERGIE D'ÉLECTRONS À L'IDENTIFICATION DE DÉPÔTS INTRA-RÉNAUX     p. C2-603
    M. Mignon-Conte, F. Carentz, J. Pourrat, J.J. Conte, Y. Kihn and J. Sevely
    Abstract | PDF file (1.543 MB)


  • QUANTITATIVE ELECTRON PROBE MICROANALYSIS OF CARBON IN CARBIDES USING A GAUSSIAN φ( ρz) EQUATION     p. C2-609
    J.D. Brown, P. Schwaab and A.P. von Rosenstiel
    Abstract | PDF file (156.4 KB)


  • X-RAY ANALYSIS OF CARBON IN 316 AUSTENITIC STAINLESS STEEL : RESULTS OF A GERMAN-FRENCH ROUND ROBIN TEST     p. C2-613
    L. Meny, C.T. Walker and M. Champigny
    Abstract | PDF file (179.2 KB)


  • APPLICATION DES MESURES DE DÉPLACEMENTS ÉNERGÉTIQUES DE LIGNES D'ÉMISSION X Mn Lα1,2 À L'IDENTIFICATION DES OXYDES DE MANGANÈSE     p. C2-617
    St. Jasieska and D. Tomkowicz
    Abstract | PDF file (177.9 KB)


  • ELECTRON PROBE MICROANALYSIS OF SUBMICRON ALLOY FILMS     p. C2-621
    P. Willich
    Abstract | PDF file (200.8 KB)


  • STUDY ON RELATIONSHIP OF PHASES IN ALLOYS BY MEANS OF EPMA     p. C2-625
    Xu Leying, Zhu Yaoxiao, Li Yiyi and Shi Changhsu
    Abstract | PDF file (966.0 KB)


  • A STUDY OF Au-Cu MINERALS USING THE ELECTRON PROBE     p. C2-631
    S.H. Mao and Y.X. Liu
    Abstract | PDF file (1.038 MB)


  • ANALYSE D' INCLUSIONS D'OXYDES RESPONSABLES DE DÉFAUTS DE SURFACE INTERNE APPARAISSANT AU COURS DE LA FABRICATION DE TUBES SANS SOUDURE     p. C2-635
    A. Harabi and R. Mevrel
    Abstract | PDF file (413.3 KB)


  • AN ELECTRON MICROSCOPE STUDY OF INCLUSIONS IN SUBMERGED-ARC STEEL WELDS     p. C2-639
    A.R. Bhatti
    Abstract | PDF file (430.3 KB)


  • X-RAY AND AUGER ELECTRON MICROANALYSIS IN STUDY OF THE CONTACT ZONE OF STEELS UNDER FRICTION     p. C2-643
    V.V. Nemoshkalenko, V.V. Gorsky, E.K. Ivanova and A.B. Goncharenko
    Abstract | PDF file (259.6 KB)


  • SPECIFIC CONTRIBUTIONS OF SIMS AND XPS TO STUDIES OF THERMAL OXIDE FILM     p. C2-647
    J.C. Pivin and D. Loison
    Abstract | PDF file (622.2 KB)


  • CHARACTERIZATION OF OXIDE FILMS ON Fe-Cr-Al ALLOYS AND RF-SPUTTERED FILMS BY SOFT X-RAY SPECTROSCOPY AND MICROANALYSIS     p. C2-653
    S. Maruno
    Abstract | PDF file (2.184 MB)


  • MICRO-ANALYSE DE CRISTAUX EN CROISSANCE SUR UNE SURFACE DE SILICIUM     p. C2-657
    J. Beauvillain, A. Claverie, Y. Kihn, J. Sevely and B. Jouffrey
    Abstract | PDF file (864.6 KB)


  • RAMAN MICROPROBE SPECTROSCOPY OF CORROSION PRODUCTS FORMED ON ELECTRODES SUBJECTED TO CORONA DISCHARGES     p. C2-661
    R. Le Ny, C. Fiaud and A.T. Nguyen
    Abstract | PDF file (921.2 KB)


  • THE CHARACTERISATION OF "ALUMINISED" INCONEL     p. C2-665
    I.F. Ferguson, T.E. Hughes, A. Huyton and B.F.Riley
    Abstract | PDF file (1.155 MB)


  • IDENTIFICATION ET ANALYSE DES PHASES DANS LES ACIERS AU MOYEN DE L'ÉMISSION IONIQUE SECONDAIRE     p. C2-673
    R. Namdar, D. Loison and R. Tixier
    Abstract | PDF file (227.4 KB)


  • OBSERVATIONS OF AMORPHOUS ALLOY CHARACTERISTICS USING THE SCANNING MICROSCOPE     p. C2-679
    J. Fléchon, F. Machizaud, F.A. Kuhnast, G. Mbemba, A. Obaida and A. Kohler
    Abstract | PDF file (899.2 KB)


  • MÉCANIQUE DES SOLIDES MICROHÉTÉROGÈNES ET EXTENSOMÉTRIE LOCALE     p. C2-683
    T. Bretheau and P. Viaris de Lesegno
    Abstract | PDF file (854.5 KB)


  • PROTOCOLE POUR UNE ANALYSE QUANTITATIVE DES PRODUITS DE COMBUSTION D'UN FUEL LOURD PAR MICROSCOPIE ÉLECTRONIQUE     p. C2-687
    R. Capron and P. Haymann
    Abstract | PDF file (88.25 KB)


  • IDENTIFICATION DE PRÉCIPITÉS DE NITRURE D'ALUMINIUM DANS DES ÉCHANTILLONS DE FER     p. C2-691
    A. Fourdeux, J. Sevely, G. Zanchi and Y. Kihn
    Abstract | PDF file (968.8 KB)


  • MICROANALYSE DES JOINTS CARBURE-CARBURE DANS LES COMPOSITES CARBURE DE TUNGSTÈNE-COBALT     p. C2-695
    J.Y. Laval, J. Vicens and G. Nouet
    Abstract | PDF file (1.841 MB)


  • X-RAY EMISSION SPECTROSCOPY OF INDUSTRIAL CATALYSTS IN THE STEM     p. C2-701
    J. Lynch
    Abstract | PDF file (1.075 MB)


  • APPLICATIONS OF A.E.M. TO RAPIDLY SOLIDIFIED MATERIALS     p. C2-705
    J.B. Vander Sande and A.J. Garratt-Reed
    Abstract | PDF file (1.278 MB)


  • EELS ANALYSIS OF A PRECIPITATE IN V3Si BY STEM AND HVEM     p. C2-709
    A. Ben Lamine, F. Reynaud, C. Colliex, M. Acheche, J. Sevely and Y. Kihn
    Abstract | PDF file (966.8 KB)


  • ÉTUDE À L'ÉCHELLE MOLÉCULAIRE, DE LA COMPOSITION, DE LA STRUCTURE ET DES PROPRIÉTÉS ÉLECTRONIQUES D'UN FILM DE POLYMÈRE ÉLECTROPOLYMÉRISÉ     p. C2-713
    G. Lecayon
    Abstract | PDF file (189.4 KB)


  • MICROANALYSE SUR LAMES MINCES, APPLICATION AUX SUPERALLIAGES MONOCRISTALLINS     p. C2-717
    C. Le Pipec
    Abstract | PDF file (124.8 KB)


  • DEPTH PROFILING AND MICROANALYSIS OF HYDROGEN IN TITANIUM     p. C2-721
    D.R. Beaman, H.E. Klassen, L.F. Solosky and D.M. File
    Abstract | PDF file (972.5 KB)


  • APPORTS DE LA MICROSONDE ÉLECTRONIQUE À L'ÉTUDE CRISTALLOCHIMIQUE DES SULFURES COMPLEXES NATURELS D'ANTIMOINE ET PLOMB     p. C2-731
    Y. Moëlo, R. Giraud and G. Remond
    Abstract | PDF file (199.3 KB)


  • APPLICATION DE LA MICROSONDE ÉLECTRONIQUE À L'ANALYSE QUANTITATIVE DES PHASES MINÉRALOGIQUES DES AGGLOMÉRÉS DE MINERAIS DE FER     p. C2-735
    S. Alfonsi, P. Barnaba, S. Fioravanti, J. Gelli, C. Modena and G. Pareto
    Abstract | PDF file (735.0 KB)


  • EVALUATION DES SUBSTITUTIONS IONIQUES DES COMPOSANTS À L'ÉTAT SOLIDE AU MOYEN DU MEB ET DU MICROANALYSEUR À RAYONS X     p. C2-741
    M. Grazzini, R. Cencioni and G. Formiconi
    Abstract | PDF file (132.3 KB)


  • APPLICATION OF EPMA OF ALMANDINE GARNETS TO REGIONAL GEOLOGICAL PROBLEMS IN THE LOWER PALEOZOIC BASEMENT OF THE NW-ARGENTINE ANDES     p. C2-745
    G. Lissner and A.P. Willner
    Abstract | PDF file (83.53 KB)


  • USE OF EPMA AND SEM IN THE STUDY OF HIGH TEMPERATURE REACTIONS IN OXIDE SYSTEMS     p. C2-747
    M. Trontelj, D. Kolar and M. Kosec
    Abstract | PDF file (976.9 KB)


  • LES COMPLEXES ORGANO-MINÉRAUX DANS LES SOLS. CARACTÉRISATION MORPHOLOGIQUE ET MICROSTRUCTURALE PAR MICROSCOPIE ÉLECTRONIQUE ET SPECTROMÉTRIE X     p. C2-751
    Nguyen Kha
    Abstract | PDF file (1.308 MB)


  • ELECTRON MICROPROBE STUDIES ON MONOMODE OPTICAL FIBRES AND PREFORMS PREPARED BY THE MCVD TECHNIQUE     p. C2-757
    A.P. Skeats and B.J. Ainslie
    Abstract | PDF file (1.050 MB)


  • SEMIQUANTITATIVE X-RAY MICROANALYSIS ON PREFORMS FOR OPTICAL WAVEGUIDE FIBRES     p. C2-761
    J. Hersener, H.-P. Huber and J. Von Wienskowski
    Abstract | PDF file (1.324 MB)


  • MICROANALYSE RAMAN DE PRÉFORMES ET FIBRES OPTIQUES     p. C2-765
    W. Carvalho and P. Dumas
    Abstract | PDF file (145.6 KB)


  • GLASSES FOR MICROANALYSIS : NEW NBS (U.S.A.) STANDARD REFERENCE MATERIALS     p. C2-769
    R.B. Marinenko and D.H. Blackburn
    Abstract | PDF file (173.8 KB)


  • MICROBEAM ANALYSIS OF SAMPLES OF UNUSUAL SHAPE     p. C2-775
    D.E. Newbury
    Abstract | PDF file (416.5 KB)


  • AUTOMATED QUANTITATIVE ELECTRON MICROPROBE ANALYSIS OF PARTICULATE MATERIAL     p. C2-781
    P. Van Dyck, H. Storms and R. Van Grieken
    Abstract | PDF file (171.1 KB)


  • LAMMA AND ELECTRON MICROPROBE ANALYSIS OF ATMOSPHERIC AEROSOLS     p. C2-785
    F. Bruynseels, H. Storms and R. Van Grieken
    Abstract | PDF file (163.9 KB)


  • CARACTÉRISATION DE FINES PARTICULES DANS DIVERS PRÉLÈVEMENTS ATMOSPHÉRIQUES EN MICROSCOPIE ANALYTIQUE EN TRANSMISSION     p. C2-789
    A. Gaudichet
    Abstract | PDF file (468.6 KB)


  • UTILISATION D'UN MICROSCOPE STEM POUR L'ANALYSE DE MINÉRAUX MICROCRISTALLISÉS, PAR SPECTROSCOPIE X ET PAR SPECTROSCOPIE DES PERTES D'ÉNERGIE     p. C2-793
    M. Rautureau, M. Steinberg, C. Colliex, C. Morry and P. Trebbia
    Abstract | PDF file (377.8 KB)


  • TECHNIQUES D'ANALYSE QUANTITATIVE PAR ÉMISSION IONIQUE SECONDAIRE : APPLICATION AUX MESURES ET AUX MICROGRAPHIES IONIQUES EN PÉTROLOGIE     p. C2-797
    A. Havette
    Abstract | PDF file (136.7 KB)


  • ANALYSE DES SURFACES SOLIDES PAR S.I.M.S. UTILISANT UN FAISCEAU PRIMAIRE DE PARTICULES NEUTRALISÉES     p. C2-801
    G. Borchardt, S. Weber, H. Scherrer and S. Scherrer
    Abstract | PDF file (157.6 KB)


  • LA MICROANALYSE PAR EFFET RAMAN DES SÉDIMENTS CARBONATÉS : PROBLÈMES D'INTERPRÉTATION DES SPECTRES     p. C2-805
    J. Archambault, A. Lautie and R. Lefevre
    Abstract | PDF file (185.0 KB)


  • APPLICATIONS OF THE MOLE RAMAN MICROPROBE TO THE STUDY OF FLUID INCLUSIONS IN MINERALS     p. C2-811
    J. Dubessy, C. Beny, N. Guilhaumou, P. Dhamelincourt and B. Poty
    Abstract | PDF file (650.4 KB)


  • MICROANALYSE DE VERRES POUR LE STOCKAGE DES DÉCHETS DE HAUTE ACTIVITÉ     p. C2-815
    J.P. Morlevat
    Abstract | PDF file (827.0 KB)


  • ÉTUDE DE LA DÉTECTION DES HYDROCARBURES AROMATIQUES POLYCYCLIQUES AU NIVEAU DE MICROPARTICULES DE NATURE DIFFÉRENTE PAR MICROSONDE À IMPACT LASER LAMMA     p. C2-819
    F. Verdun and J.F. Muller
    Abstract | PDF file (412.5 KB)


  • APPLICATION DE LA MICROSONDE BLINDÉE À L'ANALYSE DE RÉSIDUS DE DISSOLUTION DES COMBUSTIBLES NUCLÉAIRES     p. C2-825
    M. Perrot and M. Trotabas
    Abstract | PDF file (133.9 KB)


  • THE USE OF THE ELECTRON-PROBE MICROANALYSER TO DETERMINE THE RADIAL DISTRIBUTION OF FISSION PRODUCTS IN IRRADIATED THERMAL REACTOR FUEL     p. C2-829
    J.H. Pearce
    Abstract | PDF file (604.4 KB)


  • LOCALIZING FISSION PRODUCTS IN IRRADIATED NUCLEAR FUEL PARTICLES WITH THE UNSHIELDED ELECTRON MICROPROBE     p. C2-833
    H.B. Grübmeier
    Abstract | PDF file (1.212 MB)


  • ÉVOLUTION DE LA COMPOSITION CHIMIQUE D'ACIERS INOXYDABLES SOUS IRRADIATION PAR LES NEUTRONS RAPIDES     p. C2-837
    L. Boulanger, H. Lorant and M.P. Hugon
    Abstract | PDF file (1.146 MB)


  • APPLICATION OF ESCA AND AES TO HIGHLY RADIOACTIVE MATERIALS     p. C2-841
    J.R. Naegele
    Abstract | PDF file (661.8 KB)


  • INSTALLATION D'UN MICROSCOPE ÉLECTRONIQUE À BALAYAGE POUR EXAMEN DE MATÉRIAUX IRRADIÉS     p. C2-845
    M. Coquerelle, P. Knappik and Cl. Perrier
    Abstract | PDF file (875.8 KB)


  • THE EXAMINATION OF NUCLEAR FUEL SAMPLES BY SCANNING TRANSMISSION ELECTRON MICROSCOPY     p. C2-849
    I.L.F. Ray, H. Thiele and H. Blank
    Abstract | PDF file (1.000 MB)


  • STUDIES OF SEMICONDUCTORS WITH ELECTRON AND ION BEAMS     p. C2-855
    D.B. Wittry
    Abstract | PDF file (441.2 KB)


  • SEM EBIC INVESTIGATIONS OF ZnO VARISTOR CERAMICS     p. C2-861
    A. Bernds, K. Löhnert and E. Kubalek
    Abstract | PDF file (749.9 KB)


  • MINORITY CARRIER LIFETIME MEASUREMENTS IN SEMICONDUCTOR DEVICES MONITORED BY A MICROPROCESSOR IN E.B.I.C, MODE     p. C2-865
    J.F. Bresse and D. Rivière
    Abstract | PDF file (972.5 KB)


  • NONLINEAR SCANNING ELECTRON ACOUSTIC MICROSCOPY     p. C2-869
    L.J. Balk and N. Kultscher
    Abstract | PDF file (1.216 MB)


  • SCANNING ELECTRON ACOUSTIC MICROSCOPY WITH SUBNANOSECOND TIME RESOLUTION     p. C2-873
    L.J. Balk and N. Kultscher
    Abstract | PDF file (2.165 MB)


  • THERMAL WAVE IMAGING OF GaAs MATERIAL AND DEVICES     p. C2-877
    T.D. Kirkendall and T.P. Remmel
    Abstract | PDF file (1.738 MB)


  • SMALL AREA MOLECULAR ANALYSIS AS APPLIED IN THE MICROELECTRONICS INDUSTRY     p. C2-881
    J.N. Ramsey
    Abstract | PDF file (1.161 MB)


  • ELECTRONIC STRUCTURE OF AMORPHOUS Si3N4     p. C2-887
    I.A. Brytov, E.A. Obolenskii, Yu.N. Romashchenko and V.A. Gritsenko
    Abstract | PDF file (715.8 KB)


  • X RAYS AND ELECTRON MICROPROBE ANALYSIS OF III-V SEMICONDUCTORS     p. C2-891
    C. Schiller and M. Duseaux
    Abstract | PDF file (505.3 KB)


  • AUTOMATED MEASUREMENTS OF INTEGRATED CIRCUIT LINEWIDTHS BY ELECTRON MICROSCOPY     p. C2-895
    G.S. Fritz, J.J. McCarthy and J. Benson
    Abstract | PDF file (1.521 MB)


  • X-RAY SPECTROSCOPY OF HUMAN SKIN AS A CONTAMINANT ON SEMICONDUCTORS     p. C2-899
    J.A. Lange
    Abstract | PDF file (469.1 KB)


  • CRYSTALLINE STRUCTURE AND DOPING LEVEL OF THIN ELECTROLUMINESCENT ZnS:Mn LAYERS     p. C2-903
    A. Izrael, P. Thioulouse and R. Tueta
    Abstract | PDF file (789.1 KB)