SURFACE-WAVE RESONANCE METHOD FOR MEASURING SURFACE TENSION WITH A VERY HIGH PRECISION

M. IINO; M. SUZUKI; A.J. IKUSHIMA

doi:doi:10.1051/jphyscol:198510178

Issue		J. Phys. Colloques Volume 46, Number C10, Décembre 1985 Eighth International Conference on Internal Friction and Ultrasonic Attenuation in Solids


Page(s)		C10-813 - C10-816
DOI		http://dx.doi.org/10.1051/jphyscol:198510178

Eighth International Conference on Internal Friction and Ultrasonic Attenuation in Solids

J. Phys. Colloques 46 (1985) C10-813-C10-816
DOI: 10.1051/jphyscol:198510178

SURFACE-WAVE RESONANCE METHOD FOR MEASURING SURFACE TENSION WITH A VERY HIGH PRECISION

M. IINO, M. SUZUKI and A.J. IKUSHIMA

The Institute for Solid State Physics, The University of Tokyo, Roppongi, Minato-ku, Tokyo 106, Japan

Abstract
A very precise method for measuring surface tension using the resonance of surface waves on a liquid in a cavity has been developed. The method was then used to measure the surface tension of liquid helium, ³He and ⁴He , giving an absolute accuracy of about 0.5 mdyne/cm and a sensitivity of 10 µdyne/cm or better. Further possible applications of this method are discussed.